Lead Guest Editor
University of Lille Nord de France, Artois University, Jean Perrin Faculty of Science,
Guidelines for Submission
Manuscripts can be submitted until the expiry of the deadline. Submissions must be previously unpublished and may not be under consideration elsewhere.
Papers should be formatted according to the guidelines for authors (see: http://www.sciencepublishinggroup.com/journal/guideforauthors?journalid=226
). By submitting your manuscripts to the special issue, you are acknowledging that you accept the rules established for publication of manuscripts, including agreement to pay the Article Processing Charges for the manuscripts. Manuscripts should be submitted electronically through the online manuscript submission system at http://www.sciencepublishinggroup.com/login
. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal and will be listed together on the special issue website.
The special issue currently is open for paper submission. Potential authors are humbly requested to submit an electronic copy of their complete manuscript by clicking here
Nanoscience research is based on the development of new materials. The objective is to achieve new properties. The study of these properties requires the conservation of these new materials (in particular insulator and fragile) in their natural state during their observation and analysis. Obtaining and developing innovative materials needs the use of a suitable tool of characterization such as the variable pressure/environmental scanning and Transmission electron microscope (ESEM or ETEM).
Conventional Scanning and Transmission Electron Microscopy (CSEM and CTEM) equipped with a Microanalysis system are a convenient tool to analyze and to follow the structural evolution of the heterogeneous materials and working under high vacuum (about 10-5 Torr). In order to avoid sample preparation which introduces some artefacts and spent more energy this conventional technique is not suitable. Difficulty arises for insulating hydrated and biological materials. There is a much interest in introducing the gas environment in the specimen chamber which leads to the degradation of the high vacuum. The electron beam scattering by gaseous environment is the fundamental parameter limiting the performance of the Gaseous Scanning and Transmission Electron Microscopy (GSEM and GTEM). The beam skirt produced by the presence of the gas affects imagery and the microanalysis results by decreasing the resolution and different gases were used (water vapor, air, argon, nitrogen, helium….). Examples of application concerning materials, nanomaterials and environment are more encouraged.