Cost Effective Method to Locate the Vulnerable Nodes of Circuits Against the Electrical Fast Transients
Journal of Electrical and Electronic Engineering
Volume 3, Issue 2-1, March 2015, Pages: 72-77
Received: Jan. 16, 2015; Accepted: Jan. 19, 2015; Published: Feb. 10, 2015
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Behnam Gholamrezazadeh Family, Communication Department, Niroo Research Institute, Tehran, Iran
Vahid Hamiyaty Vaghef, Communication Department, Niroo Research Institute, Tehran, Iran
Maryam Shabro, Communication Department, Niroo Research Institute, Tehran, Iran
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Electrical Fast Transients (EFT) pulses may cause a large number of circuits to fail. Switching power supplies, inductors, contact relays, and high voltage switches electrically or electromagnetically strike the data, address and control lines of processors, memory elements, or even analog parts and leads to soft or permanent errors. In general, compliant test is accomplished to address the susceptibility of circuits to EFT pulses. However, extremely high cost of these tests encounters the compliant test with difficulty. As a result, in this paper a low-cost EFT simulator circuit is proposed to locate the vulnerable parts of the circuit. The approach is easily applicable to any point of any circuit. The design is performed such that the proposed circuit does not damage the Equipment Under Test (EUT). Experimental results show that the proposed approach effectively detects the vulnerable circuits and practically has been used at the design phase of the DTPS-8C device.
Electromagnetic Compatibility, EFT/B, Switching, Protection Devices
To cite this article
Behnam Gholamrezazadeh Family, Vahid Hamiyaty Vaghef, Maryam Shabro, Cost Effective Method to Locate the Vulnerable Nodes of Circuits Against the Electrical Fast Transients, Journal of Electrical and Electronic Engineering. Special Issue: Research and Practices in Electrical and Electronic Engineering in Developing Countries. Vol. 3, No. 2-1, 2015, pp. 72-77. doi: 10.11648/j.jeee.s.2015030201.26
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