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Residual Stress Measurement in Micro-region Using Digital Image Correlation Method
Optics
Volume 4, Issue 3-1, June 2015, Pages: 29-32
Received: Mar. 29, 2015; Accepted: Jul. 15, 2015; Published: Sep. 2, 2015
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Authors
Yanjie Li, School of Civil Engineering and Architecture, University of Jinan, Jinan, China
Guang Han, School of Civil Engineering and Architecture, University of Jinan, Jinan, China
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Abstract
The residual stress of the zirconia film on a stainless steel substrate is measured using the digital image correlation (DIC) method. A lattice structure is milled by focused ion beam (FIB) and used as the deformation carrier. An annular groove is etched by FIB in order to release the residual stress. The DIC method is used to calculate the deformation caused by the release of residual stress and the residual stress is derived by mechanics equations. The results demonstrate that this method can be extended for micro-region residual stress measurement of other thin films on substrates.
Keywords
Digital Image Correlation (DIC), Focused Ion Beam (FIB), Residual Stress
To cite this article
Yanjie Li, Guang Han, Residual Stress Measurement in Micro-region Using Digital Image Correlation Method, Optics. Special Issue: Optical Techniques for Deformation, Structure and Shape Evaluation. Vol. 4, No. 3-1, 2015, pp. 29-32. doi: 10.11648/j.optics.s.2015040301.17
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