Please enter verification code
Confirm
Home / Journals / Physics / Optics / Article
Effect of preparation condition on the optical properties of transparent conducting oxide based on zinc oxide
Optics
Volume 4, Issue 3, June 2015, Pages: 17-24
Received: Oct. 11, 2014; Accepted: Oct. 20, 2014; Published: Sep. 22, 2015
Views 5043      Downloads 113
Authors
Mostafa Mohamed Abd El-Raheem, Physics Department, Faculty of Science, Taif University, Taif, Saudi Arabia; Physics Department, Faculty of Science, Sohag University, Sohag, Egypt
Hoda Hamid Al-Ofi, Physics Department, Faculty of Science, Taif University, Taif, Saudi Arabia
Abdullah Alhuthali, Physics Department, Faculty of Science, Taif University, Taif, Saudi Arabia
Ateyyah Moshrif AL-Baradi, Physics Department, Faculty of Science, Taif University, Taif, Saudi Arabia
Article Tools
Follow on us
Abstract
Thin films of Al2ZnO4 were prepared using DC sputtering technique at room temperature. One set of the films of different thicknesses were prepared under the same condition of preparation, another one was prepared under different rate of flow of argon, the last set was prepared under different pressure of the gas. The optical energy gap, Urbach tails, refractive index of the films, single oscillator energy and dispersion energy were studied. The effect of changing the condition of preparation on the optical constants was investigated.
Keywords
Tin Film, Sputtering, Optical Gap, Refractive Index, Urbach Tails, Dispersion Energy
To cite this article
Mostafa Mohamed Abd El-Raheem, Hoda Hamid Al-Ofi, Abdullah Alhuthali, Ateyyah Moshrif AL-Baradi, Effect of preparation condition on the optical properties of transparent conducting oxide based on zinc oxide, Optics. Vol. 4, No. 3, 2015, pp. 17-24. doi: 10.11648/j.optics.20150403.11
References
[1]
Jeong Soo, and Kyung Hwan Kim, Transaction on electrical and electronic materials 2(2) (2011) 76-79.
[2]
B. Szyszka, Thin Solid Films 351 (1999) 164.
[3]
O. Kluth, B. Rech, L. Houben, S. Wagner, A. Loffi, H. W. Schock, Thin Solid Films, 352 (1999) 247.
[4]
M. J. Alam, D. C. Cameron, J. Vac. Sci. Technol. A 19(4) (2001) 1642.
[5]
M. J. Alam, D. C. Cameron, Surf. Coat. Technol 142-144 (2001) 776.
[6]
P. Nunes, E. Fortunato, P. Tonello, F. Braz Fernandez, P. Vilarinho, R. Martins, Vacuum 64 (2002) 281.
[7]
T. Minami, S. Susuki, T. Miyata, Thin Solid Films 398-399 (2001) 53.
[8]
M. Bertolotti, M. V. Laschena, M. Rossi, A. Ferrari, L. S. Qian, F. Quaranta, A. Valentini, J. Mater. Res. 5 ((9) (1990) 1929.
[9]
K. –S. Weibenrieder, J. MuEller, Thin Solid Films 300 (1997) 3.
[10]
J. L. Deschanvres, B. Bochu, J. C. Joubert, J. Phys. 4(3) (1993) 485.
[11]
J. Yoo, J. Lee, S. Kim, K. Yoon, I. Jun Park, S. K. Dhungel, B. Karunagaran, D. Mangalaraj, Junsin Yi, Thin Solid Films 480-481 (2005) 213-217.
[12]
J.-H. Lee, B.-O. Park, Mater. Sci. Eng. B 106 (2004) 242.
[13]
S. Major, S. Kumar, M. Bhatnagar, K. L. Chopra, Appl. Hys. Lett. 49 (1986) 394.
[14]
S. H. Mohamed, H. M. Ali, H. A. Mohamed, A. M. Salim, Eur. Phys. J. Appl. Phys. 31 (2005) 95-99.
[15]
A. E. Jimenez-Gonzalez, J. A. S. Urueta, R. Suarez-Parra, J. Cryst. Growth 192 (1998) 430-43.
[16]
Y. Cao, L. Miao, S. Tanemura, M. Tanemura, Y. Kuno, Y. Hayashi, and Y. Mori, J. Appl. Phys. 45 (2006) 1623-1628.
[17]
W. W. Wenas, A. Yamada, M. Konagai, K. Takahashi, Jpn. J. Appl. Phys. 30 (1991) L441.
[18]
T. Tsuchiya, T. Emoto, T. Sei, J. Non-Cryst. Solids 178 (1994) 327.
[19]
M. de la, L Olvera, A. Maldonado, R. Asomoza, M. Mele ndez-Lira, Sol. Energy mater, Sol. Cells 71 (2002) 61.
[20]
J. A. Anna Selvan, H. Keppner, A. Shah, mater. Res. Soc. Symp. Proc. 426 (1996) 497.
[21]
J. C. Hsu, C. C. Lee, Appl. Opt/ 37 (1998) 1171.
[22]
U. Pal, D. Samanta, S. Ghori, and A. K. Chaudhuri, J. Appl. Phys. 74 (10) (1993) 6368.
[23]
H. M. Ali, Phys. Status Solidi A 202, (2005) 2742.
[24]
M.M. El-Nahass, J. Mater. Sci. 27 (1992) 6592.
[25]
A.M. Bakry, A.H. El-Naggar, Thin Solid Films 360 (2000) 293.
[26]
F. Urbach, Phys. Rev. 92 (1953) 1324.
[27]
S. H. Wemple and DiDomenco. Rev. B7 (1973) 3767.
[28]
T. Tsuji, and M. Hirohashi, Appl. Surf. Sci. 157 (200) 47.
[29]
J. Y. Seto, J. Appl. Phys 26 (1975) 5247.
[30]
M. D. Barankin, E. Gonzalez II, A. M. Ladwing, R. F. Hicks, Solar Energy Materials & Solar Cells 91 (2007) 924-930.
[31]
S.H. Jeong, J.W. Lee, S.B. Lee, J.H. Boo, Thin Solid Films 435 (2003) 78–82.
[32]
Yunus Akaltun, M. Ali Yıldırım, Aytunç Ateş Muhammet Yıld, Optics Communications 284 (2011) 2307–2311.
[33]
M. M. Abd El-Raheem, H. M. Ali, N. M. El-Husainy, Journal of optoelectronics and advanced materials 11 (2009) 813-819.
[34]
B. A. Mansour, H. Shaban, S. A. Gad, Y. A. El-Gendy, A. M.Salem, Journal of Ovonic Research,Vol. 6, No.1,( 2010), p. 13 – 22.
[35]
Chin-Chiuan Kuo, Chi-Chang Liu, Shao-Chih He, Jing-Tang Chang, and Ju-Liang He, Journal of nanomaterials, volume 2012, article ID 562701, 8 pages.
[36]
J. Yoo, J. Lee, S. Kim, K. Yoon, I. Jun Park, S. K. Dhungel, B. Karunagaran, D. Mangalaraj, Junsin Yi, Thin Solid Films 480-481 (2005) 213-217.
[37]
Yasuhiro Igasaki, Hirokazu Kanma, Applied Surface Science 169-170 (2001) 508-511.
[38]
V. Assuncao , E. Fortunato *, A. Marques , H. Aguas , I. Ferreira , M.E.V. Costa , R. Martins, Thin Solid Films 427 (2003) 401–405.
ADDRESS
Science Publishing Group
1 Rockefeller Plaza,
10th and 11th Floors,
New York, NY 10020
U.S.A.
Tel: (001)347-983-5186