Ions Beam Properties Produced by NX2 Plasma Focus Device with Helium and Nitrogen Gas
American Journal of Modern Physics
Volume 8, Issue 1, January 2019, Pages: 1-4
Received: Mar. 21, 2019; Accepted: Apr. 22, 2019; Published: May 9, 2019
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Authors
Sahyouni Walid, Plasma Physics Research Unit, Department of Physics, Faculty of Science, Al-Baath University, Homs, Syria
Nassif Alaa, Plasma Physics Research Unit, Department of Physics, Faculty of Science, Al-Baath University, Homs, Syria
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Abstract
Numerical experiments carried out using the Lee code to study some properties of ions beam (flux, fluence and ion beam energy) produced by the NX2 dense plasma device when using light gas (helium) and heavy gas (nitrogen) when gas pressure changes. The results showed that in the case of light gas (helium), the flux and fluence of the beam were higher while the ion beam energy was higher in the case of heavy gas (nitrogen) because the effective charge of nitrogen's ion is greater and also the voltage generated by the collapse of pinch was higher.
Keywords
Dense Plasma Focus, Plasma Pinch, Lee Code
To cite this article
Sahyouni Walid, Nassif Alaa, Ions Beam Properties Produced by NX2 Plasma Focus Device with Helium and Nitrogen Gas, American Journal of Modern Physics. Vol. 8, No. 1, 2019, pp. 1-4. doi: 10.11648/j.ajmp.20190801.11
Copyright
Copyright © 2019 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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