The New Software for Research and the Modelling of Grown-in Microdefects in Dislocation-Free Silicon Single Crystals
Engineering and Applied Sciences
Volume 3, Issue 1, February 2018, Pages: 1-5
Received: Dec. 5, 2017;
Accepted: Dec. 18, 2017;
Published: Jan. 11, 2018
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Vitalyi Igorevich Talanin, Department of Computer Science & Software Development, Institute of Economics & Information Technologies, Zaporozhye, Ukraine
Igor Evgenievich Talanin, Department of Computer Science & Software Development, Institute of Economics & Information Technologies, Zaporozhye, Ukraine
Vladislav Igorevich Lashko, Department of Computer Science & Software Development, Institute of Economics & Information Technologies, Zaporozhye, Ukraine
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As a virtual experimental device for research and the modelling of grown-in microdefects formation in dislocation-free silicon single crystals the software is proposed. The software is built on the basis on diffusion model of grown-in microdefects formation and allows the use of computer to investigate the defect structure of silicon monocrystals with a diameter up to 400 mm.
Silicon, Grown-in Microdefects, Diffusion Model, Software
To cite this article
Vitalyi Igorevich Talanin,
Igor Evgenievich Talanin,
Vladislav Igorevich Lashko,
The New Software for Research and the Modelling of Grown-in Microdefects in Dislocation-Free Silicon Single Crystals, Engineering and Applied Sciences.
Vol. 3, No. 1,
2018, pp. 1-5.
Copyright © 2018 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/
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